TY  - RPRT
TI  - A Theoretical Investigation of Surface Roughness Scattering in Silicon Nanowire Transistors
AU  - Jing Wang
AU  - Eric Polizzi
AU  - Avik Ghosh
AU  - Supriyo Datta
AU  - Mark Lundstrom
PY  - 2005
DO  - 10.1063/1.2001158
UR  - https://arxiv.org/abs/cond-mat/0502538
ID  - cond-mat/0502538
ER  -