TY  - RPRT
TI  - Ab-initio simulations on growth and interface properties of epitaxial oxides on silicon
AU  - Clemens J. Foerst
AU  - Christopher R. Ashman
AU  - Karlheinz Schwarz
AU  - Peter E. Bloechl
PY  - 2005
DO  - 10.1016/j.mee.2005.04.100
UR  - https://arxiv.org/abs/cond-mat/0504256
ID  - cond-mat/0504256
ER  -