TY  - RPRT
TI  - Structural and Electronic Properties of the Interface between the High-k oxide LaAlO3 and Si(001)
AU  - Clemens J. Foerst
AU  - Karlheinz Schwarz
AU  - Peter E. Bloechl
PY  - 2005
DO  - 10.1103/physrevlett.95.137602
UR  - https://arxiv.org/abs/cond-mat/0505013
ID  - cond-mat/0505013
ER  -