TY  - RPRT
TI  - Raman Measurements and Stress Analysis in Gallium Ion Implanted Gallium Nitride Epitaxial Layers on Sapphire
AU  - S. Mal
AU  - A. Singha
AU  - S. Dhara
AU  - A. Roy
PY  - 2006
DO  - 10.1016/j.tsf.2006.07.018
UR  - https://arxiv.org/abs/cond-mat/0505335
ID  - cond-mat/0505335
ER  -