TY  - RPRT
TI  - Modeling of micro- and nano-scale domain recording by high-voltage atomic force microscopy in ferroelectrics-semiconductors
AU  - Anna N. Morozovska
AU  - Eugene A. Eliseev
PY  - 2005
DO  - 10.1016/j.physb.2005.11.049
UR  - https://arxiv.org/abs/cond-mat/0505391
ID  - cond-mat/0505391
ER  -