TY  - RPRT
TI  - Large-scale electronic-structure theory and nanoscale defects formed in cleavage process of silicon
AU  - T. Hoshi
AU  - R. Takayama
AU  - Y. Iguchi
AU  - T. Fujiwara
PY  - 2005
DO  - 10.1016/j.physb.2005.12.243
UR  - https://arxiv.org/abs/cond-mat/0508277
ID  - cond-mat/0508277
ER  -