@misc{indiciae87312cc5c591,
  title = {Low frequency noise statistics for the breakdown characterization of ultra-thin gate oxides},
  author = {N. Z. Butt and A. M. Chang and H. Raza and R. Bashir and J. Liu and D. L. Kwong},
  year = {2005},
  doi = {10.1063/1.2186114},
  url = {https://arxiv.org/abs/cond-mat/0508370},
  note = {Source identifier: cond-mat/0508370}
}