TY  - RPRT
TI  - Low frequency noise statistics for the breakdown characterization of ultra-thin gate oxides
AU  - N. Z. Butt
AU  - A. M. Chang
AU  - H. Raza
AU  - R. Bashir
AU  - J. Liu
AU  - D. L. Kwong
PY  - 2005
DO  - 10.1063/1.2186114
UR  - https://arxiv.org/abs/cond-mat/0508370
ID  - cond-mat/0508370
ER  -