TY  - RPRT
TI  - Modelling and Simulation of Charging and Discharging Processes in Nanocrystal Flash Memories During Program and Erase Operations
AU  - Andrea Campera
AU  - Giuseppe Iannaccone
PY  - 2005
DO  - 10.1016/j.sse.2005.10.002
UR  - https://arxiv.org/abs/cond-mat/0509099
ID  - cond-mat/0509099
ER  -