TY  - RPRT
TI  - Comparison of the properties of GaN grown on complex Si-based structures
AU  - Shengqiang Zhou
AU  - A. Vantomme
AU  - B. S. Zhang
AU  - H. Yang
AU  - M. F. Wu
PY  - 2005
DO  - 10.1063/1.1868870
UR  - https://arxiv.org/abs/cond-mat/0510222
ID  - cond-mat/0510222
ER  -