TY  - RPRT
TI  - Simulated ion-sputtering and Auger electron spectroscopy depth profiling study of intermixing in Cu/Co
AU  - M. Menyhárd
AU  - P. Süle
PY  - 2005
UR  - https://arxiv.org/abs/cond-mat/0512053
ID  - cond-mat/0512053
ER  -