TY  - RPRT
TI  - Electron correlations and bond-length fluctuations in layered copper oxides: electron versus hole doping
AU  - L. Hozoi
AU  - S. Nishimoto
PY  - 2006
DO  - 10.1103/physrevb.73.245101
UR  - https://arxiv.org/abs/cond-mat/0512219
ID  - cond-mat/0512219
ER  -