TY  - RPRT
TI  - Stress-enhanced ion diffusion at the vicinity of a crack tip as evidenced by atomic force microscopy in silicate glasses
AU  - F. Celarie
AU  - M. Ciccotti
AU  - C. Marliere
PY  - 2006
UR  - https://arxiv.org/abs/cond-mat/0512567
ID  - cond-mat/0512567
ER  -