@misc{indiciae1dcdf9dcaaf4,
  title = {Infrared Imaging of the Nanometer-Thick Accumulation Layer in Organic Field-Effect Transistors},
  author = {Z. Q. Li and G. M. Wang and N. Sai and D. Moses and M. C. Martin and M. Di Ventra and A. J. Heeger and D. N. Basov},
  year = {2006},
  doi = {10.1021/nl052166+},
  url = {https://arxiv.org/abs/cond-mat/0602229},
  note = {Source identifier: cond-mat/0602229}
}