@misc{indiciaeea244dccc41f,
  title = {Potential Profiling of the Nanometer-Scale Charge Depletion Layer in n-ZnO/p-NiO Junction Using Photoemission Spectroscopy},
  author = {Y. Ishida and H. Ohta and M. Hirano and A. Fujimori and H. Hosono},
  year = {2006},
  doi = {10.1063/1.2358858},
  url = {https://arxiv.org/abs/cond-mat/0604549},
  note = {Source identifier: cond-mat/0604549}
}