TY  - RPRT
TI  - Potential Profiling of the Nanometer-Scale Charge Depletion Layer in n-ZnO/p-NiO Junction Using Photoemission Spectroscopy
AU  - Y. Ishida
AU  - H. Ohta
AU  - M. Hirano
AU  - A. Fujimori
AU  - H. Hosono
PY  - 2006
DO  - 10.1063/1.2358858
UR  - https://arxiv.org/abs/cond-mat/0604549
ID  - cond-mat/0604549
ER  -