TY  - RPRT
TI  - Mechanisms of weak thickness dependence of the critical current density in strong pinning ex situ metal-organic-deposition route YBa2Cu3O7-x coated conductors
AU  - S. I. Kim
AU  - A. Gurevich
AU  - X. Song
AU  - X. Li
AU  - W. Zhang
AU  - T. Kodenkandath
AU  - M. W. Rupich
AU  - T. G. Holesinger
AU  - D. C. Larbalestier
PY  - 2006
DO  - 10.1088/0953-2048/19/9/013
UR  - https://arxiv.org/abs/cond-mat/0605613
ID  - cond-mat/0605613
ER  -