TY  - RPRT
TI  - Modelling of tunnelling currents in Hf-based gate stacks as a function of temperature and extraction of material parameters
AU  - Andrea Campera
AU  - Giuseppe Iannaccone
AU  - Felice Crupi
PY  - 2006
DO  - 10.1109/ted.2006.887202
UR  - https://arxiv.org/abs/cond-mat/0609403
ID  - cond-mat/0609403
ER  -