@misc{indiciae7fe70a38a9c3,
  title = {Smearing origin of zero-bias conductance peak in Ag-SiO-Bi-2212 planar tunnel junctions: influence of diffusive normal metal verified with the circuit theory},
  author = {Iduru Shigeta and Yukio Tanaka and Fusao Ichikawa and Yasuhiro Asano},
  year = {2007},
  doi = {10.1140/epjb/e2006-00440-2},
  url = {https://arxiv.org/abs/cond-mat/0610888},
  note = {Source identifier: cond-mat/0610888}
}