TY  - RPRT
TI  - Smearing origin of zero-bias conductance peak in Ag-SiO-Bi-2212 planar tunnel junctions: influence of diffusive normal metal verified with the circuit theory
AU  - Iduru Shigeta
AU  - Yukio Tanaka
AU  - Fusao Ichikawa
AU  - Yasuhiro Asano
PY  - 2007
DO  - 10.1140/epjb/e2006-00440-2
UR  - https://arxiv.org/abs/cond-mat/0610888
ID  - cond-mat/0610888
ER  -