@misc{indiciaed8e28459f874,
  title = {Characterization of Disorder in Semiconductors via Single-Photon Interferometry},
  author = {P. Bozsoki and P. Thomas and M. Kira and W. Hoyer and T. Meier and S. W. Koch and K. Maschke and I. Varga and H. Stolz},
  year = {2006},
  doi = {10.1103/physrevlett.97.227402},
  url = {https://arxiv.org/abs/cond-mat/0611411},
  note = {Source identifier: cond-mat/0611411}
}