TY  - RPRT
TI  - Double Gate Bias Dependency of Low Temperature Conductivity of SiO2-Si-SiO2 Quantum Wells
AU  - M. Prunnila
AU  - J. M. Kivioja
AU  - J. Ahopelto
PY  - 2006
DO  - 10.1063/1.2730024
UR  - https://arxiv.org/abs/cond-mat/0611705
ID  - cond-mat/0611705
ER  -