TY  - RPRT
TI  - Morphological stability of electromigration-driven vacancy islands
AU  - Frank Hausser
AU  - Philipp Kuhn
AU  - Joachim Krug
AU  - Axel Voigt
PY  - 2007
DO  - 10.1103/physreve.75.046210
UR  - https://arxiv.org/abs/cond-mat/0701208
ID  - cond-mat/0701208
ER  -