TY  - RPRT
TI  - Influence of structural disorder on low-temperature behavior of penetration depth in electron-doped high-T_C thin films
AU  - A. J. C. Lanfredi
AU  - S. Sergeenkov
AU  - F. M. Araujo-Moreira
PY  - 2007
DO  - 10.1016/j.physc.2006.08.008
UR  - https://arxiv.org/abs/cond-mat/0701457
ID  - cond-mat/0701457
ER  -