TY  - RPRT
TI  - Characterization of irradiated microstructure by X-ray diffraction line profile analysis
AU  - A. Sarkar
AU  - P. Mukherjee
AU  - P. Barat
PY  - 2007
DO  - 10.1007/s11661-007-9428-7
UR  - https://arxiv.org/abs/cond-mat/0701644
ID  - cond-mat/0701644
ER  -