@misc{indiciaead7d3266fcc1,
  title = {In situ growth regime characterization of cubic GaN using reflection high energy electron diffraction},
  author = {J. Schoermann and S. Potthast and D. J. As and K. Lischka},
  year = {2007},
  doi = {10.1063/1.2432293},
  url = {https://arxiv.org/abs/cond-mat/0702018},
  note = {Source identifier: cond-mat/0702018}
}