TY  - RPRT
TI  - In situ growth regime characterization of cubic GaN using reflection high energy electron diffraction
AU  - J. Schoermann
AU  - S. Potthast
AU  - D. J. As
AU  - K. Lischka
PY  - 2007
DO  - 10.1063/1.2432293
UR  - https://arxiv.org/abs/cond-mat/0702018
ID  - cond-mat/0702018
ER  -