TY  - RPRT
TI  - Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width
AU  - A. Sarkar
AU  - P. Mukherjee
AU  - P. Barat
PY  - 2007
UR  - https://arxiv.org/abs/cond-mat/0702262
ID  - cond-mat/0702262
ER  -