TY  - RPRT
TI  - The structural properties of the multi-layer graphene/4H-SiC(000-1) system as determined by Surface X-ray Diffraction
AU  - J. Hass
AU  - R. Feng
AU  - J. E. Millan-Otoya
AU  - X. Li
AU  - M. Sprinkle
AU  - P. N. First
AU  - C. Berger
AU  - W. A. de Heer
AU  - E. H. Conrad
PY  - 2007
DO  - 10.1103/physrevb.75.214109
UR  - https://arxiv.org/abs/cond-mat/0702540
ID  - cond-mat/0702540
ER  -