TY  - RPRT
TI  - Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope
AU  - Atif Imtiaz
AU  - Steven M. Anlage
AU  - John D. Barry
AU  - John Melngailis
PY  - 2007
DO  - 10.1063/1.2719164
UR  - https://arxiv.org/abs/cond-mat/0703241
ID  - cond-mat/0703241
ER  -