TY  - RPRT
TI  - Oscillatory Thickness Dependence of Magnetic Moments and interface-induced Changes of the Exchange Coupling in Co/Cu and Co-Ni/Cu Multilayers
AU  - S. Krompiewski
AU  - F. Süss
AU  - U. Krey
PY  - 1995
DO  - 10.1016/0304-8853(95)00086-0
UR  - https://arxiv.org/abs/cond-mat/9509164
ID  - cond-mat/9509164
ER  -