TY  - RPRT
TI  - NiO Exchange Bias Layers Grown by Direct Ion Beam Sputtering of a Nickel Oxide Target
AU  - Richard P. Michel
AU  - A. Chaiken
AU  - Young K. Kim
AU  - Lantz E. Johnson
PY  - 1996
DO  - 10.1109/20.539107
UR  - https://arxiv.org/abs/cond-mat/9606052
ID  - cond-mat/9606052
ER  -