TY  - RPRT
TI  - On Properties of Boundaries and Electron Conductivity in Mesoscopic Polycrystalline Silicon Films for Memory Devices
AU  - G. P. Berman
AU  - G. D. Doolen
AU  - R. Mainieri
AU  - J. Rehacek
AU  - D. K. Campbell
AU  - V. A. Luchnikov
AU  - K. E. Nagaev
PY  - 1998
UR  - https://arxiv.org/abs/cond-mat/9802022
ID  - cond-mat/9802022
ER  -