TY  - RPRT
TI  - Temperature-frequency scaling in amorphous niobium-silicon near the metal-insulator transition
AU  - Hok-Ling Lee
AU  - John P. Carini
AU  - David V. Baxter
AU  - George Gruner
PY  - 1998
DO  - 10.1103/physrevlett.80.4261
UR  - https://arxiv.org/abs/cond-mat/9802056
ID  - cond-mat/9802056
ER  -