@misc{indiciaea51d638e02d6,
  title = {Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions},
  author = {B. J. Feenstra and C. P. Vlahacos and Ashfaq S. Thanawalla and D. E. Steinhauer and S. K. Dutta and F. C. Wellstood and Steven M. Anlage},
  year = {1998},
  doi = {10.1109/mwsym.1998.705152},
  url = {https://arxiv.org/abs/cond-mat/9802293},
  note = {Source identifier: cond-mat/9802293}
}