TY  - RPRT
TI  - Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
AU  - B. J. Feenstra
AU  - C. P. Vlahacos
AU  - Ashfaq S. Thanawalla
AU  - D. E. Steinhauer
AU  - S. K. Dutta
AU  - F. C. Wellstood
AU  - Steven M. Anlage
PY  - 1998
DO  - 10.1109/mwsym.1998.705152
UR  - https://arxiv.org/abs/cond-mat/9802293
ID  - cond-mat/9802293
ER  -