TY  - RPRT
TI  - A Multiscale Approach to Determination of Thermal Properties and Changes in Free Energy: Application to Reconstruction of Dislocations in Silicon
AU  - T. D. Engeness
AU  - T. A. Arias
PY  - 1998
DO  - 10.1103/physrevlett.79.3006
UR  - https://arxiv.org/abs/cond-mat/9805305
ID  - cond-mat/9805305
ER  -