TY  - RPRT
TI  - Influence of the exchange reaction on the electronic structure of GaN/Al junctions
AU  - S. Picozzi
AU  - A. Continenza
AU  - S. Massidda
AU  - A. J. Freeman
AU  - N. Newman
PY  - 1998
DO  - 10.1103/physrevb.58.7906
UR  - https://arxiv.org/abs/cond-mat/9806377
ID  - cond-mat/9806377
ER  -