@misc{indiciae938e3d9fce0d,
  title = {Capture of carriers to screened charged centres and low temperature shallow impurity electric field break down in semiconductors},
  author = {O. Z. Alekperov},
  year = {1998},
  doi = {10.1088/0953-8984/10/38/012},
  url = {https://arxiv.org/abs/cond-mat/9807327},
  note = {Source identifier: cond-mat/9807327}
}