TY  - RPRT
TI  - Ballistic Electron Emission Microscopy on CoSi${}_2$/Si(111) interfaces: band structure induced atomic-scale resolution and role of localized surface states
AU  - K. Reuter
AU  - F. J. Garcia-Vidal
AU  - P. L. de Andres
AU  - F. Flores
AU  - K. Heinz
PY  - 1998
DO  - 10.1103/physrevlett.81.4963
UR  - https://arxiv.org/abs/cond-mat/9810229
ID  - cond-mat/9810229
ER  -