TY  - RPRT
TI  - Structure and oxidation kinetics of the Si(100)-SiO2 interface
AU  - Kwok-On Ng
AU  - David Vanderbilt
PY  - 1998
DO  - 10.1103/physrevb.59.10132
UR  - https://arxiv.org/abs/cond-mat/9811098
ID  - cond-mat/9811098
ER  -