@misc{indiciae482126834c90,
  title = {Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope},
  author = {Steven M. Anlage and D. E. Steinhauer and C. P. Vlahacos and B. J. Feenstra and A. S. Thanawalla and Wensheng Hu and Sudeep K. Dutta and F. C. Wellstood},
  year = {1998},
  doi = {10.1109/77.783934},
  url = {https://arxiv.org/abs/cond-mat/9811158},
  note = {Source identifier: cond-mat/9811158}
}