TY  - RPRT
TI  - Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers
AU  - S. Das Sarma
AU  - E. H. Hwang
PY  - 1999
DO  - 10.1103/physrevlett.83.164
UR  - https://arxiv.org/abs/cond-mat/9812216
ID  - cond-mat/9812216
ER  -