TY  - RPRT
TI  - Comment on "Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers" (Das Sarma and Hwang, cond-mat/9812216)
AU  - S. V. Kravchenko
AU  - D. Simonian
AU  - M. P. Sarachik
PY  - 1998
UR  - https://arxiv.org/abs/cond-mat/9812331
ID  - cond-mat/9812331
ER  -