TY  - RPRT
TI  - Phase Analysis of Thin Film Oxide Systems by AES and EELS
AU  - V. G. Beshenkov
AU  - V. A. Marchenko
AU  - V. T. Volkov
AU  - A. G. Znamenskii
PY  - 1998
UR  - https://arxiv.org/abs/cond-mat/9812411
ID  - cond-mat/9812411
ER  -