TY  - RPRT
TI  - On the reorientation transition of ultra-thin Ni/Cu(001) films
AU  - A. Hucht
AU  - K. D. Usadel
PY  - 1998
DO  - 10.1016/s0304-8853(98)01200-1
UR  - https://arxiv.org/abs/cond-mat/9812421
ID  - cond-mat/9812421
ER  -