TY  - RPRT
TI  - Weak Field Hall Resistance and Effective Carrier Density Through Metal-Insulator Transition in Si-MOS Structures
AU  - V. M. Pudalov
AU  - G. Brunthaler
AU  - A. Prinz
AU  - G. Bauer
PY  - 1999
DO  - 10.1134/1.568128
UR  - https://arxiv.org/abs/cond-mat/9904233
ID  - cond-mat/9904233
ER  -