@misc{indiciaef7eb12a7edd6,
  title = {Characterization of All-Chromium Tunnel Junctions and Single Electron Tunneling Devices Fabricated by Direct-Writing Multilayer Technique},
  author = {H. Scherer and Th. Weimann and P. Hinze and B. W. Samwer and A. B. Zorin and J. Niemeyer},
  year = {1999},
  doi = {10.1063/1.371778},
  url = {https://arxiv.org/abs/cond-mat/9907078},
  note = {Source identifier: cond-mat/9907078}
}