TY  - RPRT
TI  - Characterization of All-Chromium Tunnel Junctions and Single Electron Tunneling Devices Fabricated by Direct-Writing Multilayer Technique
AU  - H. Scherer
AU  - Th. Weimann
AU  - P. Hinze
AU  - B. W. Samwer
AU  - A. B. Zorin
AU  - J. Niemeyer
PY  - 1999
DO  - 10.1063/1.371778
UR  - https://arxiv.org/abs/cond-mat/9907078
ID  - cond-mat/9907078
ER  -