TY  - RPRT
TI  - Shot noise induced charge and potential fluctuations of edge states in proximity of a gate
AU  - Markus Buttiker
PY  - 1999
DO  - 10.1007/3-540-45557-4_8
UR  - https://arxiv.org/abs/cond-mat/9908116
ID  - cond-mat/9908116
ER  -